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          Electronics

          In the realm of electrons and light, NIST provides the standards, develops the instruments and performs the calibrations necessary to keep both the smallest electronic components and the largest power grids running smoothly and safely.

          Next-Generation Chips Require Multiple Measurement Approaches

          Illustration: Computer chip in middle; surrounded by images of different scanning techniques
          Credit: G. Orji and B. Barnes/NIST
          Measurement science—or metrology—is critically important in computer chips, from design to manufacturing and quality control.

          The metrology requirements for next-generation computer chips are stringent and specialized. No single instrument has the speed and sensitivity that’s needed to characterize a host of complex material parameters and measure all of a chip’s dimensions—the tiny sizes and distances between its various features.

          Learn more about NIST's work in this space.

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          Projects and Programs

          Advanced Microwave Photonics

          Research on quantum information (QI) seeks to control and exploit exotic properties of quantum mechanics, and researchers are already generating "unbreakable"

          Advanced High Frequency Devices

          The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at high

          Publications

          Streaming Batch Eigenupdates for Hardware Neural Networks

          Author(s)
          Brian D. Hoskins, Matthew W. Daniels, Siyuan Huang, Advait Madhavan, Gina C. Adam, Nikolai B. Zhitenev, Jabez J. McClelland, Mark D. Stiles
          Neuromorphic networks based on nanodevices, such as metal oxide memristors, phase change memories, and flash memory cells, have generated considerable interest

          Quantized Pulse Propagation in Josephson Junction Arrays

          Author(s)
          Christine A. Donnelly, Justus A. Brevik, Nathan E. Flowers-Jacobs, Anna E. Fox, Paul D. Dresselhaus, Peter F. Hopkins, Samuel P. Benz
          We present time-domain electrical measurements and simulations of the quantized voltage pulses that are generated from series-connected Josephson junction (JJ)

          Software

          On-Wafer Calibration Software

          NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the

          Timebase Correction Software

          The Timebase Correction (TBC) software package , used with high-speed sampling oscilloscopes, can correct both random and systematic timebase errors using

          Tools and Instruments

          Molecular Beam Epitaxy (MBE) Facility

          The Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor

          Nanocalorimeter Measurement System

          This Nanocalorimeter Measurement System is used for nanocalorimetry measurements at fast heating rates (100 °C/s to 100,000 °C/s) and measurements of samples

          Awards

          秋霞理论在一l级